Kiwa PVEL at the 54th PVSC IEEE

June 7-12, 2026.

The Kiwa PVEL team attended the PVSC IEEE 54 Conference in New Orleans, LA.

During the show, Dr. Arcahna Sinha presented on "UV-Induced Degradation in TOPCon Modules: Linking Accelerated Testing and Field Evidence," outlining how certain TOPCon modules suffer significant performance drops under high-intensity UV exposure.

Click here to view the presentation.